ExplainFuzz: Explainable and Constraint-Conditioned Test Generation with Probabilistic Circuits (bibtex)

@inproceedings{BaigetArxiv26,
  title     = {ExplainFuzz: Explainable and Constraint-Conditioned Test Generation with Probabilistic Circuits},
  author    = {Baiget, Anna\"{e}lle and Maene, Jaron and Lee, Seongmin and Wang, Benjie and Van den Broeck, Guy and Kim, Miryung},
  booktitle = {Arxiv},
  url       = "https://arxiv.org/pdf/2604.06559",
  eprint    = {2604.06559},
  archivePrefix = {arXiv},
  primaryClass = {cs.SE},
  month     = 4,
  year      = {2026},
  keywords  = {techreport}
}